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首页> 外文期刊>Journal of Applied Physics >Transport phenomena in intrinsic semiconductors and insulators at high current densities: Suppression of the broken neutrality drift
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Transport phenomena in intrinsic semiconductors and insulators at high current densities: Suppression of the broken neutrality drift

机译:高电流密度时本征半导体和绝缘体中的传输现象:中性线漂移的抑制

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摘要

It is shown that, in addition to the diffusion and broken neutrality drift (BND) modes well-known for insulators and very lightly doped semiconductors, the quasineutral drift (QND) mode is possible. The transition from the BND to QND mode is accompanied by the appearance of a portion with a very sharp current rise in the current-voltage characteristic. This effect is observed in a new type of semiconductor detectors (CIDs, Current Injected Detectors) of high-intensity neutron and proton radiation, suggested, in particular, for Large Hadron Collider. The effect is unambiguously attributed now to the presence of radiation-induced deep centers in a semiconductor. It is shown, however, in this paper that the effect of a very sharp rise in current upon a slight increase in voltage is even possible when there are no deep centers. An equation adequately describing the possible transport modes in intrinsic semiconductors and insulators is derived. The results of an analytical study are confirmed by an adequate simulation.
机译:结果表明,除了绝缘体和轻掺杂半导体中众所周知的扩散和破坏中性漂移(BND)模式外,准中性漂移(QND)模式也是可能的。从BND到QND模式的过渡伴随着电流-电压特性中出现电流急剧上升的部分。在新型的高强度中子和质子辐射的半导体探测器(CID,电流注入探测器)中观察到了这种效应,特别是对大型强子对撞机而言。现在,将这种影响明确地归因于辐射引起的半导体深中心的存在。然而,在本文中表明,当没有深中心时,即使电压略微增加,电流也可能急剧上升。得出一个足以描述本征半导体和绝缘体中可能的传输模式的方程。分析研究的结果通过适当的模拟得到证实。

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