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Method for reducing measurement errors of a Langmuir probe with a protective RF shield

机译:用保护射频屏蔽降低Langmuir探头测量误差的方法

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摘要

Probe measurements were conducted in the middle cross-section of an inductive, low-pressure xenon plasma using a straight cylindrical Langmuir probe with a bare metal shield that protected the probe from radio frequency interference. As a result, reliable radial distributions of the plasma parameters were obtained. Subsequent analyses of these measurements revealed that the electron energy distribution function (EEDF) deviated substantially from the Maxwellian functions and that this deviation depended on the length of the probe shield. To evaluate the shield's influence on the measurement results, in addition to the probe (which was moved radially as its shield length varied in the range of l(sh1) = l(max)-0), an additional L-shaped probe was inserted at a different location. This probe was moved differently from the first probe and provided confirmational measurements in the common special position where l(sh1) = 0 and l(sh2) not equal 0. In this position, the second shield decreased all the plasma parameters. A comparison of the probe datasets identified the principles of the relationships between measurement errors and EEDF distortions caused by the bare probe shields. This dependence was used to correct the measurements performed using the first probe by eliminating the influence of its shield. Physical analyses based on earlier studies showed that these peculiarities are caused by a short-circuited double-probe effect that occurs in bare metal probe protective shields. Published by AIP Publishing.
机译:使用具有直圆柱Langmuir探针的电感,低压氙等离子的中间横截面进行探针测量,该曲线柱探测器从射频干扰保护探针。结果,获得了等离子体参数的可靠径向分布。这些测量的后续分析表明,电子能量分布函数(EEDF)基本上偏离MaxWellian函数,并且该偏差依赖于探针屏蔽的长度。为了评估屏蔽对测量结果的影响,除了探针之外,除了在L(SH1)= L(max)-0的范围内变化的屏蔽长度径向移动,径向移动,插入了另外的L形探针在不同的位置。该探针与第一探针不同地移动,并且在常见的特殊位置提供了确认测量,其中L(SH1)= 0和L(SH2)不等于0.在该位置,第二屏蔽降低了所有等离子体参数。探针数据集的比较识别由裸探针屏蔽引起的测量误差和EEDF失真之间的关系的原理。这种依赖性用于通过消除其屏蔽的影响来校正使用第一探针执行的测量。基于早期研究的物理分析表明,这些特性是由在裸金属探针保护罩中发生的短路双探针效果引起的。通过AIP发布发布。

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  • 来源
    《Journal of Applied Physics》 |2018年第16期|163301.1-163301.6|共6页
  • 作者单位

    Natl Res Univ Moscow Aviat Inst RIAME 5 Leningrad Rd Moscow 125080 Russia;

    Natl Res Univ Moscow Aviat Inst RIAME 5 Leningrad Rd Moscow 125080 Russia;

    MSU Dept Phys Moscow 119991 Russia;

    MSU Dept Phys Moscow 119991 Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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