Enhanced resolution electric force microscopy with single-wall carbon nanotube tips

摘要

Electric force microscopy (EFM) is widely used for studying small-scale electrical structures. Its applicability is limited by its spatial resolution and the difficulty of deconvoluting tip effects from the image. We demonstrate that the use of single-wall carbon nanotube (SWNT) tips increases EFM spatial resolution, allowing similar features to be distinguished with separations as small as 15 nm. In addition, we show that the EFM response of the SWNT tips is consistent with a uniform-line-charge model. (C) 2004 American Institute of Physics.