首页> 外文期刊>Journal of Applied Physics >Low temperature deposition and effect of plasma power on tin oxide thin films prepared by modified plasma enhanced chemical vapor deposition
【24h】

Low temperature deposition and effect of plasma power on tin oxide thin films prepared by modified plasma enhanced chemical vapor deposition

机译:低温沉积及等离子体功率对改性等离子体增强化学气相沉积法制备的氧化锡薄膜的影响

获取原文
获取原文并翻译 | 示例
       

摘要

This work presents low temperature (200 and 300℃) thin film deposition of tin oxide (SnO_2) using modified plasma enhanced chemical vapor deposition as a function of radio frequency power (100 - 500 W). Stannic chloride (SnCl_4) was used as precursor and oxygen (O_2, 300 SCCM) as reactant gas. Fine granular morphology was observed with tetragonal rutile structure grown along the [110] direction, at all the deposition conditions. Higher plasma power resulted in smoother morphology, improved crystallinity, and enhanced conductivity. Electrical resistivity value of as low as ~0.01 Ω cm was obtained at the deposition temperature of 300℃ and 250 W of plasma power.
机译:这项工作提出了使用改良的等离子体增强化学气相沉积技术(作为射频功率(100-500 W)的函数)对氧化锡(SnO_2)进行低温(200和300℃)薄膜沉积的方法。氯化锡(SnCl_4)被用作前体,氧气(O_2,300 SCCM)被用作反应气体。在所有沉积条件下,均观察到沿[110]方向生长的具有四方金红石结构的细颗粒形态。较高的等离子体功率导致更平滑的形态,改善的结晶度和增强的电导率。在300℃的沉积温度和250 W的等离子功率下获得的电阻率值低至〜0.01Ωcm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号