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Kerr microscopy studies of microwave assisted switching

机译:微波辅助开关的Kerr显微镜研究

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摘要

We study microwave assisted magnetization reversal of elliptical Ni_(81)Fe_(19) thin film elements employing Kerr microscopy. A microwave field is applied along the short axis of the element and orthogonally to a quasistatic magnetic field, which is parallel to the long axis of the element. The reversal process is characterized by the formation of a complex multidomain structure. We demonstrate that the reversal process in total is compressed by applying a sufficiently high microwave field, which assists to overcome the effective energy barrier of the domain nucleation, and thus reduces the coercive field.
机译:我们利用Kerr显微镜研究了椭圆形Ni_(81)Fe_(19)薄膜元件的微波辅助磁化反转。沿着元件的短轴并与与元件的长轴平行的准静态磁场正交地施加微波场。逆转过程的特征在于形成复杂的多域结构。我们证明,通过施加足够高的微波场可以完全逆转过程,这有助于克服磁畴成核的有效能垒,从而减小了矫顽场。

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