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Small-angle neutron scattering in materials science: Recent practical applications

机译:材料科学中的小角中子散射:近期实际应用

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Modern materials science and engineering relies increasingly on detailed knowledge of the structure and interactions in "soft" and "hard" materials, but there have been surprisingly few microscopic techniques for probing the structures of bulk samples of these substances. Small-angle neutron scattering (SANS) was first recognized in Europe as a major technique for this purpose and, over the past several decades, has been a growth area in both academic and industrial materials research to provide structural information on length scales ~10-1000 A (or 1-100 nm). The technique of ultrahigh resolution small-angle neutron scattering (USANS) raises the upper resolution limit for structural studies by more than two orders of magnitude and (up to ~30 μm) and hence overlaps with light scattering and microscopy. This review illustrates the ongoing vitality of SANS and USANS in materials research via a range of current practical applications from both soft and hard matter nanostructured systems.
机译:现代材料科学和工程越来越依赖于对“软”和“硬”材料的结构和相互作用的详细了解,但是令人惊讶的是,很少有显微镜技术来探测这些物质的大量样品的结构。小角度中子散射(SANS)在欧洲首次被认为是实现这一目的的一项主要技术,并且在过去的几十年中,它一直是学术和工业材料研究的增长领域,可提供约10- 1000 A(或1-100 nm)。超高分辨率小角中子散射(USANS)技术将结构研究的分辨率上限提高了两个数量级以上(最高〜30μm),因此与光散射和显微镜检查重叠。本文通过软硬纳米结构系统的一系列当前实际应用,说明了SANS和USANS在材料研究中的生命力。

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