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首页> 外文期刊>Journal of Applied Physics >Microstructures of SiC nanoparticle-doped MgB_2/Fe tapes
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Microstructures of SiC nanoparticle-doped MgB_2/Fe tapes

机译:掺杂SiC纳米颗粒的MgB_2 / Fe带的微观结构

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We have studied bulk MgB_2 synthesized by reaction of MgH_2 and B with and without SiC nanoparticles and at a range of reaction temperatures. All of the samples showed enhanced upper critical fields compared to most bulk MgB_2, including the sample with 10 at. % SiC reacted at 600℃, which showed H_(c2)(0 K) > 42 T. Extensive transmission electron microscopy (TEM) and STEM observations show that using MgH_2 instead of pure Mg reduces the concentration of oxide second phases in the tapes, but that adding SiC reintroduces nanoscale grains of MgO, SiO_2, and SiO_xC_y, and larger grains of Mg_2Si. SiC causes some C doping of the MgB_2, but electron energy loss spectroscopy and x-ray diffraction measurements show that the C concentration is similar to other bulk C-doped MgB_2. In all the samples with and without SiC, the grain size is very small, 10-60 nm. Electron scattering from the high density of grains and second-phase boundaries is responsible for the enhanced H_(c2) of these samples. However, the H_(c2) properties are somewhat compromised by very broad transitions that may have their origin in the local variations of nanostructure.
机译:我们研究了在有和没有SiC纳米颗粒的情况下,在一定的反应温度下,由MgH_2和B反应生成的块状MgB_2。与大多数块状MgB_2相比,所有样品均显示出增强的上临界场,包括10 at。的样品。 %SiC在600℃下反应,表明H_(c2)(0 K)> 42T。广泛的透射电子显微镜(TEM)和STEM观察表明,使用MgH_2代替纯Mg会降低带中氧化物第二相的浓度,但是添加SiC可以重新引入MgO,SiO_2和SiO_xC_y纳米级晶粒,以及较大的Mg_2Si晶粒。 SiC引起MgB_2的一些C掺杂,但是电子能量损失谱和X射线衍射测量表明C浓度与其他块状C掺杂MgB_2相似。在所有有和没有SiC的样品中,晶粒尺寸都非常小,为10-60 nm。来自高密度晶粒和第二相边界的电子散射导致这些样品的H_(c2)增强。但是,H_(c2)性质在一定程度上受到非常宽泛的转变的影响,这些转变可能起源于纳米结构的局部变化。

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