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Effects of bias on cathodoluminescence in ZnCdSe quantum well light emitting diodes

机译:偏压对ZnCdSe量子阱发光二极管阴极发光的影响

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摘要

Bias voltages applied to Zn_(0.24)Cd_(0.76)Se quantum well light emitting diodes (QW-LEDs) affect both the intensity and wavelength of room temperature cathodoluminescence (CL). These effects have been studied experimentally and theoretically to advance understanding of the CL and optoelectronic behavior of these devices. QW CL intensity and photon energy are increased by forward bias, and they are decreased by reverse bias, with an exponential dependence of CL intensity on bias voltage from -1 to +1 V and little dependence from 1.5 to 2.5 V. The p-n junction current and electroluminescence increase rapidly for forward bias greater than 2.34 V, the calculated built-in potential. The bias dependence of QW CL intensity is little affected when electron beam currents change by ~300 times, from 0.1 to 29 nA with 10 kV beam voltage and ~ 1 μm~2 irradiated area. The QW CL intensity increases sublinearly with beam current. Small hysteresis effects are seen in bias-dependent CL intensity for low beam currents. The effects of bias voltage on CL intensity and photon energy have been modeled, including bias dependence of carrier transport, QW energy levels, wave functions, overlap integrals, internal electric fields, exciton ionization, and rates of carrier capture in and escape from the QW. For the QW-LED and experimental conditions used in this study, the bias dependence of CL intensity at room temperature results mainly from electric field dependence of exciton ionization and of electron and hole captures in the QW, and the bias dependence of CL photon energy results from field-dependent shifts in QW energy levels of electrons and holes.
机译:施加到Zn_(0.24)Cd_(0.76)Se量子阱发光二极管(QW-LED)的偏置电压会影响室温阴极发光(CL)的强度和波长。已通过实验和理论研究了这些效应,以增进对这些器件的CL和光电行为的了解。 QW CL强度和光子能量通过正向偏置而增加,而通过反向偏置而减小,其中CL强度对偏置电压的指数依赖性为-1至+1 V,而对1.5 V至2.5 V的依赖性很小。pn结电流并且正向偏压大于2.34 V(计算出的内置电位)时,电致发光会迅速增加。当电子束电流在10 kV束电压和〜1μm〜2的照射电压下,从0.1到29 nA变化约300倍时,QW CL强度的偏置依赖性几乎不受影响。 QW CL强度随着电子束电流而线性增加。对于低电子束电流,在偏置相关的CL强度中可以看到较小的磁滞效应。已对偏置电压对CL强度和光子能量的影响进行了建模,包括载流子输运,QW能级,波函数,重叠积分,内部电场,激子电离以及载流子在QW中捕获和逸出的速率与偏置的相关性。对于本研究中使用的QW-LED和实验条件,室温下CL强度的偏置依赖性主要来自激子电离和QW中电子和空穴俘获的电场依赖性,以及CL光子能量的偏置依赖性。电子和空穴的量子阱能级随场的变化而产生的。

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  • 来源
    《Journal of Applied Physics》 |2008年第11期|960-983|共24页
  • 作者单位

    Department of Materials Science and Engineering, Lehigh University, Bethlehem, Pennsylvania 18015, USA;

    Department of Materials Science and Engineering, Lehigh University, Bethlehem, Pennsylvania 18015, USA;

    Department of Chemistry, City College-CUNY, New York, New York 10031, USA;

    Department of Chemistry, City College-CUNY, New York, New York 10031, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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