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Thermal conductivity and Seebeck coefficients of icosahedral boron arsenide films on silicon carbide

机译:碳化硅上二十面体砷化硼薄膜的热导率和塞贝克系数

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摘要

The thermal conductivity of icosahedral boron arsenide (B_(12)As_2) films grown on (0001) 6H-SiC substrates by chemical vapor deposition was studied by the 3w technique. The room temperature thermal conductivity decreased from 27.0 to 15.3 W/m K as the growth temperature was decreased from 1450 to 1275 ℃. This is mainly attributed to the differences in the impurity concentration and microstructure, determined from secondary ion mass spectrometry and high resolution transmission electron microscopy, respectively. Callaway's theory was applied to calculate the temperature-dependent thermal conductivity, and the results are in good agreement with the experimental data. Seebeck coefficients were determined as 107 μV/K and 136 μV/K for samples grown at 1350 ℃ with AsH_3/B_2H_6 flow ratio equals to 1:1 and 3:5, respectively.
机译:利用3w技术研究了在(0001)6H-SiC衬底上化学气相沉积生长的二十面体砷化硼(B_(12)As_2)薄膜的热导率。随着生长温度从1450降低到1275℃,室温热导率从27.0降低到15.3 W / mK。这主要归因于杂质浓度和微观结构的差异,分别通过二次离子质谱和高分辨率透射电子显微镜确定。用卡拉威理论计算了随温度变化的导热系数,其结果与实验数据吻合良好。在1350℃下生长的样品中,AsH_3 / B_2H_6流量比分别为1:1和3:5,塞贝克系数分别确定为107μV/ K和136μV/ K。

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  • 来源
    《Journal of Applied Physics》 |2010年第8期|p.084906.1-084906.7|共7页
  • 作者单位

    H.H. Wills Physics Laboratory, Centre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, United Kingdom;

    rnDepartment of Materials Science and Engineering, Stony Brook University, Stony Brook, New York 11794-2275, USA;

    rnDepartment of Materials Science and Engineering, Stony Brook University, Stony Brook, New York 11794-2275, USA;

    rnDepartment of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, USA;

    rnDepartment of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, USA;

    rnInterface Analysis Centre, University of Bristol, Bristol BS2 8BS, United Kingdom;

    rnH.H. Wills Physics Laboratory, Centre for Device Thermography and Reliability (CDTR), University of Bristol, Bristol BS8 1TL, United Kingdom;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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