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Charge carrier density of organics with Gaussian density of states: Analytical approximation for the Gauss-Fermi integral

机译:具有高斯状态密度的有机物的载流子密度:高斯-费米积分的解析近似

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摘要

Active layers in organic devices prepared in solution based preparation routes are usually disordered. Their highest occupied molecular orbitals and lowest unoccupied molecular orbitals, or the valence and conduction band states, show an energetic distribution which can be approximated by a Gaussian density of states (DOS). The resulting dependency of the (electron and hole) mobility on temperature, carrier density, and field can be easily implemented into advanced device simulation programs. However, in addition the charge carrier density is needed as the integral over the DOS multiplied with the Fermi-Dirac distribution. We denote this normalized quantity as the Gauss-Fermi integral. Since it cannot be evaluated analytically, similarly as in the case of the Fermi-Dirac integral F_(1/2), an analytical approximation is needed for efficient device simulation. In the present article, such an approximation is proposed with different expressions in the nondegenerate and degenerate regions with a continuous and differentiable transition between both regions. The approximation is also applicable to traps with a Gaussian DOS.
机译:在基于溶液的制备路线中制备的有机器件中的活性层通常是无序的。它们的最高占据分子轨道和最低未占据分子轨道,或化合价和导带态,显示出一个高能分布,可以用高斯态密度(DOS)近似。由此产生的(电子和空穴)迁移率对温度,载流子密度和电场的依赖性可以很容易地在高级器件仿真程序中实现。但是,此外,还需要将电荷载流子密度作为DOS上的积分乘以Fermi-Dirac分布。我们将此归一化数量表示为高斯-费米积分。由于无法像费米-狄拉克积分F_(1/2)一样进行解析评估,因此需要有效的设备仿真进行解析近似。在本文中,提出了在非简并和简并区域中具有不同表达式的近似,两个区域之间具有连续且可区分的过渡。近似值也适用于具有高斯DOS的陷阱。

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  • 来源
    《Journal of Applied Physics》 |2010年第10期|P.104501.1-104501.4|共4页
  • 作者单位

    Leibniz Institute for Solid State and Materials Research, IFW Dresden, PF 270116, D-01171 Dresden,Germany;

    Institute of Solid State Electronics, Ilmenau Technical University, PF 100565, D-98684 Ilmenau, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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