机译:在(001),(011)和(111)Si衬底上生长的SiGe层中弛豫和位错的高分辨率x射线衍射研究
Department of Theoretical Physics, Belarusian State University, 4 Fr. Nezavisimosti Avenue, 220030 Minsk, Republic of Belarus;
Department of Theoretical Physics, Belarusian State University, 4 Fr. Nezavisimosti Avenue, 220030 Minsk, Republic of Belarus;
Bruker AXS GmbH, Ostliche Rheinbruckenstrasse 49, 76187 Karlsruhe, Germany;
Bruker AXS GmbH, Ostliche Rheinbruckenstrasse 49, 76187 Karlsruhe, Germany;
Department of Physics, The University of Warwick, Coventry CV4 7AL, United Kingdom;
Department of Physics, The University of Warwick, Coventry CV4 7AL, United Kingdom;
Department of Physics, The University of Warwick, Coventry CV4 7AL, United Kingdom;
Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen, Germany;
机译:通过分子束外延在Si(001)和Ge(001)衬底上生长的SiGe外延层的结构研究:Ⅰ-高分辨率x射线衍射和x射线形貌
机译:通过共面和非共面X射线衍射表征在(011)和(111)取向硅上生长的锗层中的位错
机译:具有超薄Ge夹层的Si(001)衬底上SiGe缓冲层中的位错结构和应变松弛
机译:高分辨率x射线衍射研究在邻近GaAs(001)衬底上生长的GaSb外延层
机译:银(001)和银(111)上超薄外延铬和氧化铁膜的生长和结构:通过X射线光电子衍射和低能电子衍射完成的综合研究。
机译:通过共面和非共面X射线衍射表征在(011)和(111)取向硅上生长的锗层中的位错
机译:通过共面和非共面X射线衍射表征在(011)和(111)取向硅上生长的锗层中的位错
机译:在未对准的Gaas(001)衬底上研究mBE生长的InGaas层中的错配位错构型