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首页> 外文期刊>Journal of Applied Physics >Ultrananocrystalline diamond nano-pillars synthesized by microwave plasma bias-enhanced nucleation and bias-enhanced growth in hydrogen-diluted methane
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Ultrananocrystalline diamond nano-pillars synthesized by microwave plasma bias-enhanced nucleation and bias-enhanced growth in hydrogen-diluted methane

机译:微波等离子体在氢稀释甲烷中偏置增强成核和偏置生长合成的超纳米晶金刚石纳米柱

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摘要

Bias-enhanced nucleation and growth of ultrananocrystalline diamond (UNCD) nano-pillars on silicon substrates by low-pressure microwave plasma chemical vapor deposition in a hydrogen-rich gas mixture with methane is reported. Direct-current biasing of the substrate in a constant-current mode is applied to substrates, which are pre-heated to 800 ℃, to result in a negative bias voltage of greater than 350 V throughout the nucleation and growth process. Self-masking by UNCD clusters, angle dependent sputtering of UNCD clusters, and ion-assisted chemical vapor deposition by bias enhanced bombardment of energetic ions are attributed to the formation of UNCD nano-pillars. High-resolution transmission electron microscopy analysis indicates that an interfacial layer exists between the silicon substrate and the UNCD nano-pillars. The porous UNCD film with high-density nano-pillars exhibits excellent optical anti-reflectivity and improved electron field emission characteristics compared to smooth and solid UNCD films.
机译:据报道,通过在富含氢气的甲烷气体中进行低压微波等离子体化学气相沉积,在硅基板上增强了超纳米晶金刚石(UNCD)纳米柱的偏置成核和生长。以恒定电流模式对基板施加直流偏压,将其预热至800℃,从而在整个成核和生长过程中产生大于350 V的负偏压。 UNCD团簇的自我掩盖,UNCD团簇的角度依赖性溅射以及通过高能离子的偏向增强轰击进行的离子辅助化学气相沉积均归因于UNCD纳米柱的形成。高分辨率透射电子显微镜分析表明,在硅基底和UNCD纳米柱之间存在界面层。与光滑和固态的UNCD膜相比,具有高密度纳米柱的多孔UNCD膜具有出色的光学抗反射性和改善的电子场发射特性。

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  • 来源
    《Journal of Applied Physics》 |2012年第12期|124307.1-124307.6|共6页
  • 作者单位

    Institute of Microelectronics, National Cheng Kung University No. I, University Road, Tainan 701, Taiwan;

    Department of Materials Science and Engineering, National Cheng Kung University No. I, University Road, Tainan 701, Taiwan;

    Department of Materials Science and Engineering, National Cheng Kung University No. I, University Road, Tainan 701, Taiwan;

    Institute of Microelectronics, National Cheng Kung University No. I, University Road, Tainan 701, Taiwan,Advanced Optoelectronics Technology Center, No. I, University Road, Tainan 701, Taiwan;

    Materials Science Division Argonne National Laboratory 9700 S. Cass Avenue, Argonne, Illinois 60439, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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