机译:点接触安德列夫反射法测定RFe_2(R = Dy,Er,Y)的自旋极化
Clarendon Laboratory, Oxford University, Oxford 0X1 3PU, United Kingdom;
School of Physics and Astronomy, University of Southampton, Southampton SO17 1B], United Kingdom Department of Physics, National University of Defense Technology, Changsha 410073, Hunan, China;
School of Physics and Astronomy, University of Southampton, Southampton SO17 1BJ, United Kingdom;
Clarendon Laboratory, Oxford University, Oxford 0X1 3PU, United Kingdom;
School of Physics and Astronomy, University of Southampton, Southampton SO17 1BJ, United Kingdom;
机译:通过点接触Andreev反射确定RFe2的自旋极化(R = Dy,Er,Y)
机译:点接触安德列夫反射法测定d和Dy的自旋极化
机译:APS -APS 2017年3月会议-活动-通过点接触Andreev反射探测Heusler合金薄膜的自旋极化
机译:通过点接触和令触点反射测定Gd和Dy的旋转极化
机译:点接触式安德列夫反射光谱仪用于测量自旋极化。
机译:自旋分辨量子霍尔体态与自旋超导体结的等自旋安德烈耶夫反射
机译:通过点接触Andreev反射确定RFe2的自旋极化(R = Dy,Er,Y)