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First-principles calculation of intrinsic carrier mobility of silicene

机译:硅固有载流子迁移率的第一性原理计算

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摘要

The intrinsic carrier mobility of silicene is calculated using first-principles methods incorporating density functional theory, Boltzman transport equation, and the deformation potential theory. The electron mobility is 2.57 × 10~5 cm~2V~(-1)s~(-1) and the hole mobility is 2.22 × 10~5 cm~2V~(-1)s~(-1) at room temperature, which is smaller than that of graphene but still very high.
机译:硅的固有载流子迁移率是使用结合密度泛函理论,玻尔兹曼输运方程和形变势能理论的第一原理方法计算的。在室温下电子迁移率为2.57×10〜5 cm〜2V〜(-1)s〜(-1),空穴迁移率为2.22×10〜5 cm〜2V〜(-1)s〜(-1) ,比石墨烯小,但仍然很高。

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  • 来源
    《Journal of Applied Physics》 |2013年第9期|093712.1-093712.3|共3页
  • 作者单位

    Laboratory of Quantum Engineering and Quantum Materials, SPTE, South China Normal University, Guangzhou 510006, China;

    Laboratory of Quantum Engineering and Quantum Materials, SPTE, South China Normal University, Guangzhou 510006, China;

    Institute of Modern Physics, Chinese Academy of Sciences, and Department of Physics, Lanzhou University, Lanzhou 730000, China;

    Institute of Modern Physics, Chinese Academy of Sciences, and Department of Physics, Lanzhou University, Lanzhou 730000, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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