机译:原位X射线衍射分析确定脉冲极化对四方Pb(Ti,Zr)O_3薄膜中静态和动态铁弹性域贡献的影响
Department of Innovative and Engineered Material, Tokyo Institute of Technology, Yokohama 226-8503, Japan,NTT Device Technology Laboratories, Nippon Telegraph and Telephone, 3-1, Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan;
Department of Innovative and Engineered Material, Tokyo Institute of Technology, Yokohama 226-8503, Japan;
Department of Materials, Physics and Energy Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan,PRESTO, Japan Science and Technology Agency, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan;
Department of Innovative and Engineered Material, Tokyo Institute of Technology, Yokohama 226-8503, Japan;
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki 305-8564, Japan;
Department of Innovative and Engineered Material, Tokyo Institute of Technology, Yokohama 226-8503, Japan;
机译:原位X射线衍射分析确定脉冲极化对四方Pb(Ti,Zr)O
机译:CoFe_2O_4 / Pb(Zr_(0.52)Ti_(0.48))O_3 2-2-型双层薄膜中Pb(Zr_(0.52)Ti_(0.48))O_3相变的原位X射线衍射分析
机译:双极脉冲极化对微机电系统微悬臂梁上四方晶系Pb(Zr_(0.3),Ti_(0.7))O_3薄膜的铁电和压电性能的影响
机译:PB的有效方向控制(Zr_(0.4)Ti_(0.6))O_3使用新型Ti / Pb的薄膜(Zr_(0.4)Ti_(0.6))O_3播种层
机译:(100)/(001)取向四方外延Pb(Zr0.4Ti0.6)O3薄膜在电场作用下超快90°域转换的原位观察
机译:用于基于全氧化物$ LaNiO_3 / pb(Zr,Ti)O_3 / LaNiO_3薄膜的压电mEms器件的大面积脉冲激光沉积和组装工艺
机译:用X射线衍射研究pb(Zr,Ti)O(sub 3)薄膜的开关行为