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首页> 外文期刊>Journal of Applied Physics >Study of valence-band intersublevel transitions in InAs/GaAs quantum dots-in-well infrared photodetectors
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Study of valence-band intersublevel transitions in InAs/GaAs quantum dots-in-well infrared photodetectors

机译:InAs / GaAs量子点阱红外光电探测器中价带子间跃迁的研究

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摘要

The n-type quantum dot (QD) and dots-in-well (DWELL) infrared photodetectors, in general, display bias-dependent multiple-band response as a result of optical transitions between different quantum levels. Here, we present a unique characteristic of the p-type hole response, a well-preserved spectral profile, due to the much reduced tunneling probability of holes compared to electrons. This feature remains in a DWELL detector, with the dominant transition contributing to the response occurring between the QD ground state and the quantum-well states. The bias-independent response will benefit applications where single-color detection is desired and also allows achieving optimum performance by optimizing the bias.
机译:通常,由于不同量子级之间的光学跃迁,n型量子点(QD)和阱中点(DWELL)红外光电探测器显示依赖于偏压的多波段响应。在这里,由于与电子相比,空穴的隧穿几率大大降低,因此我们呈现出p型空穴响应的独特特征,即光谱保存完好的光谱。此功能保留在DWELL检测器中,主要的跃迁有助于QD基态和量子阱状态之间的响应发生。独立于偏置的响应将有益于需要单色检测的应用,并且还可以通过优化偏置来实现最佳性能。

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  • 来源
    《Journal of Applied Physics 》 |2014年第17期| 171113.1-171113.5| 共5页
  • 作者单位

    Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303, USA;

    Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303, USA;

    Department of Physics and Astronomy, Georgia State University, Atlanta, Georgia 30303, USA;

    Key Laboratory of Artificial Structures and Quantum Control, Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China;

    Key Laboratory of Artificial Structures and Quantum Control, Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China;

    Center for High Technology Materials, Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87106, USA;

    Center for High Technology Materials, Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87106, USA;

    Center for High Technology Materials, Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87106, USA;

    Center for High Technology Materials, Department of Electrical and Computer Engineering, University of New Mexico, Albuquerque, New Mexico 87106, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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