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首页> 外文期刊>Journal of Applied Physics >Polarization characteristics of electroluminescence and net modal gain in highly stacked InAs/GaAs quantum-dot laser devices
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Polarization characteristics of electroluminescence and net modal gain in highly stacked InAs/GaAs quantum-dot laser devices

机译:高度堆叠的InAs / GaAs量子点激光器件中电致发光的偏振特性和净模态增益

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摘要

We studied the polarization anisotropy of electroluminescence (EL) and net modal gain characteristics of laser device structures containing 40 stacked InAs/GaAs quantum dot (QD) layers. The electronic coupling between the closely stacked QDs enhanced the transverse-magnetic (TM) polarization component owing to the heavy- and light-hole mixing. Thereby, the [110]-waveguide devices exhibited a laser oscillation of not only the transverse-electric (TE) but also the TM component. Laser oscillation occurred at 1137 nm from the first excited state for the 300-μm-long cavity, while it occurred at 1167 nm from the ground state for the 1000-μm-long cavity. The polarization anisotropy of the EL intensity strongly depended on the injection current density. The polarized EL intensity was almost isotropic at low injection current density. As the injection current density was increased, the TE component was gradually enhanced, which resulted in a markedly TE-dominant anisotropy above the threshold current density for laser oscillation. The net modal gains evaluated using the Hakki-Paoli method also exhibited a TE-enhanced characteristic with increasing injection current density. As the EL spectra of the TE component have an inhomogeneous broadening narrower than that of the TM component, the TE-mode intensity is likely to be enhanced by the concentration of the injected carriers.
机译:我们研究了电致发光(EL)的偏振各向异性和包含40个堆叠的InAs / GaAs量子点(QD)层的激光器件结构的净模态增益特性。由于重孔和轻孔混合,紧密堆叠的量子点之间的电子耦合增强了横向磁(TM)极化分量。从而,[110]波导装置不仅表现出横向电(TE),而且表现出TM分量的激光振荡。对于300μm长的腔,激光在距第一个激发态1137 nm处发生,而对于1000μm长的腔,在距基态1167 nm处发生。 EL强度的极化各向异性很大程度上取决于注入电流密度。在低注入电流密度下,极化的EL强度几乎各向同性。随着注入电流密度的增加,TE分量逐渐增强,这导致在激光振荡的阈值电流密度之上,TE的各向异性显着增加。使用Hakki-Paoli方法评估的净模态增益还随着注入电流密度的增加而表现出TE增强的特性。由于TE组分的EL光谱具有比TM组分窄的不均匀扩宽,因此TE模式强度可能会因注入的载流子浓度而增强。

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  • 来源
    《Journal of Applied Physics》 |2016年第13期|134313.1-134313.6|共6页
  • 作者单位

    Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501, Japan;

    Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501, Japan;

    Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501, Japan;

    Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501, Japan;

    Department of Electrical and Electronic Engineering, Graduate School of Engineering, Kobe University, 1-1 Rokkodai, Nada, Kobe 657-8501, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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