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Optical properties and band bending of InGaAs/GaAsBi/InGaAs type-Ⅱ quantum well grown by gas source molecular beam epitaxy

机译:气源分子束外延生长InGaAs / GaAsBi / InGaAsⅡ型量子阱的光学性质和能带弯曲

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摘要

Photoluminescence (PL) properties of In_(0.2)Ga_(0.8)As/GaAs_(0.96)Bi_(0.04)/In_(0.2)Ga_(0.8)As quantum well (QW) grown on GaAs substrates by gas source molecular beam epitaxy were studied by varying excitation power and temperature, respectively. The type-Ⅱ transition energy shifts from 1.149eV to 1.192 eV when increasing the excitation power from 10 mW to 150 mW at 4.5 K, which was ascribed to the band-bending effect. On the other hand, the type-Ⅱ PL quenches quickly along with fast redshift with the increasing temperature due to the relaxation of the band bending caused by the thermal excitation process. An 8 band k·p model was used to analyze the electronic properties and the band-bending effect in the type-Ⅱ QW. The calculated subband levels and transition energy fit well with the experiment results, and two thermal activation energies of 8.7 meV and 50meV, respectively, are deduced.
机译:通过气体源分子束外延生长在GaAs衬底上的In_(0.2)Ga_(0.8)As / GaAs_(0.96)Bi_(0.04)/ In_(0.2)Ga_(0.8)As量子阱(QW)的光致发光(PL)特性是通过分别改变激励功率和温度进行研究。当激发功率在4.5 K下从10 mW增加到150 mW时,Ⅱ型跃迁能量从1.149eV变为1.192 eV,这归因于带弯曲效应。另一方面,由于热激发过程引起的能带弯曲的缓和,随着温度的升高,Ⅱ型PL随快速红移迅速淬灭。用8带k·p模型分析了Ⅱ型量子阱中的电子特性和带弯曲效应。计算出的子带能级和跃迁能量与实验结果非常吻合,并推导出两个分别为8.7 meV和50meV的热激活能。

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  • 来源
    《Journal of Applied Physics》 |2016年第10期|105702.1-105702.6|共6页
  • 作者单位

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, 865 Changning Road, Shanghai 200050, China,University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100190, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, 865 Changning Road, Shanghai 200050, China;

    National Laboratory for Infrared Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai 200083, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, 865 Changning Road, Shanghai 200050, China;

    National Laboratory for Infrared Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai 200083, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, 865 Changning Road, Shanghai 200050, China,University of Chinese Academy of Sciences, Chinese Academy of Sciences, Beijing 100190, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, 865 Changning Road, Shanghai 200050, China,School of Physical Science and Technology, ShanghaiTech University, Shanghai 201210, China;

    National Laboratory for Infrared Physics, Chinese Academy of Sciences, 500 Yutian Road, Shanghai 200083, China;

    State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, 865 Changning Road, Shanghai 200050, China,Department of Microtechnology and Nanoscience, Chalmers University of Technology, Gothenburg 41296, Sweden;

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