首页> 外文期刊>Journal of Applied Physics >Tuning the metal-insulator transition via epitaxial strain and Co doping in NdNiO_3 thin films grown by polymer-assisted deposition
【24h】

Tuning the metal-insulator transition via epitaxial strain and Co doping in NdNiO_3 thin films grown by polymer-assisted deposition

机译:通过外延应变和Co掺杂来调节聚合物辅助沉积生长的NdNiO_3薄膜中的金属-绝缘体转变

获取原文
获取原文并翻译 | 示例
           

摘要

The epitaxial NdNi_(1-x)Co_xO_3(0 ≤ x ≤ 0.10) thin films on (001) LaAlO_3 and (001) SrTiO_3 substrates were grown by a simple polymer-assisted deposition technique. The co-function of the epitaxial strain and Co doping on the metal-insulator transition in perovskite nickelate NdNiO_3 thin films is investigated. X-ray diffraction and scanning electron microscopy reveal that the as-prepared thin films exhibit good crystallinity and heteroepitaxy. The temperature dependent resistivities of the thin films indicate that both the epitaxial strain and Co doping lower the metal-insulator (MI) transition temperature, which can be treated as a way to tune the MI transition. Furthermore, under the investigated Co-doping levels, the MI transition temperature (T_(MI)) shifts to low temperatures with Co content increasing under both compressive and tensile strain, and the more distinction is in the former situation. When x is increased up to 0.10, the insulating phase is completely suppressed under the compressive strain. With the strain increases from compression to tension, the resistivities are enhanced both in the metal and insulating regions. However, the Co-doping effect on the resistivity shows a more complex situation. As Co content x increases from zero to 0.10, the resistivities are reduced both in the metal and insulating regions under the tensile strain, whereas they are enhanced in the high-temperature metal region under the compressive strain. Based on the temperature dependent resistivity in the metal regions, it is suggested that the electron-phonon coupling in the films becomes weaker with the increase of both the strain and Co-doping.
机译:通过简单的聚合物辅助沉积技术在(001)LaAlO_3和(001)SrTiO_3衬底上生长外延NdNi_(1-x)Co_xO_3(0≤x≤0.10)薄膜。研究了钙钛矿型镍酸盐NdNiO_3薄膜中外延应变和Co掺杂对金属-绝缘体跃迁的影响。 X射线衍射和扫描电子显微镜显示,所制备的薄膜表现出良好的结晶性和异质外延性。薄膜的随温度变化的电阻率表明,外延应变和Co掺杂均会降低金属-绝缘体(MI)的转变温度,可以将其视为调整MI转变的一种方式。此外,在研究的Co掺杂水平下,MI转变温度(T_(MI))在压缩应变和拉伸应变下都随着Co含量的增加而转变为低温,并且在前一种情况下存在更多区别。当x增加到0.10时,在压缩应变下绝缘相被完全抑制。随着应变从压缩到拉伸的增加,在金属和绝缘区域的电阻率都会增加。然而,共掺杂​​对电阻率的影响显示出更复杂的情况。当Co含量x从零增加到0.10时,在拉伸应变下金属和绝缘区域中的电阻率都降低,而在压缩应变下高温金属区域中的电阻率都增加。基于金属区域中随温度变化的电阻率,建议随着应变和Co掺杂的增加,薄膜中的电子-声子耦合变弱。

著录项

  • 来源
    《Journal of Applied Physics》 |2016年第3期|035303.1-035303.7|共7页
  • 作者单位

    Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China;

    Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China;

    Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China;

    Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China;

    Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China;

    Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People's Republic of China;

    Instrumental Analysis Center, Hefei University of Technology, Hefei, Anhui 230009, People's Republic of China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号