Twin domains in epitaxial thin MnSi layers on Si(111)

摘要

Thin layers of MnSi, the first discovered host material of a skyrmion lattice, are epitaxially grown on Si( 111) and their crystal properties are investigated by X-ray diffraction and transmission electron microscopy (TEM) measurements. Azimuthal  -scans of asymmetric X-ray reflections reveal the formation of twinned domains with their unit cell rotated ± 30° in plane with respect to the Si unit cell. The intensities of corresponding reflections indicate the same volume fractions for both domain types. Cross-sectional TEM confirms the presence of these domains and reveals a typical domain size of about 200 nm.