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Modification of defects and potential fluctuations in slow-cooled and quenched Cu_2ZnSnSe_4 single crystals

机译:Cu_2ZnSnSe_4慢冷淬火晶体的缺陷和电势波动的修正

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Recent literature reports have shown the ability to manipulate Cu-Zn cation ordering for Cu_2ZnSnSe_4 (CZTSe) via low temperature treatments. Theoretical arguments suggest that one of the major roadblocks to higher V_(OC)-significant band tailing-could be improved with increased cation order; however, few direct measurements have been reported and significant device improvements have not yet been realized. This report investigates electrical properties, defects, and devices from quenched and slow-cooled single crystals of CZTSe. The extent of disorder was characterized by Raman spectroscopy as well as x-ray diffraction, where the change in Cu-Zn order can be detected by a changing c/a ratio. Quenched samples show higher acceptor concentrations, lower hole mobilities, and a lower-energy photoluminescence (PL) peak than crystals cooled at slower rates, consistent with a reduction in the bandgap. In addition, samples quenched at the highest temperatures showed lower PL yield consistent with higher quantities of deep defects. Devices fabricated using slow-cooled CZTSe single crystals showed improved efficiencies, most notably with increased V_(OC): however, low temperature intensity-dependent photoluminescence measurements continue to indicate the existence of potential fluctuations. We discuss the possibility that potential fluctuations in slow-cooled samples may be related to the inability to achieve a long range order of the Cu-Zn sub-lattice resulting in local regions of high and low levels of cation order, and consequent local variations in the bandgap. The presence of significant potential fluctuations, even after the slow-cooling step, suggests the difficulty in eliminating band-tailing in this system, and thus, additional approaches may be needed for significant reduction of the V_(OC) deficit.
机译:最近的文献报道显示了能够通过低温处理来控制Cu_2ZnSnSe_4(CZTSe)的Cu-Zn阳离子有序性的能力。理论上的争论表明,可以通过增加阳离子序数来改善更高的V_(OC)-显着带拖尾的主要障碍之一。然而,几乎没有直接测量的报道,并且尚未实现重大的设备改进。该报告调查了CZTSe淬火和慢冷单晶的电性能,缺陷和器件。通过拉曼光谱法和X射线衍射来表征无序程度,其中可以通过改变c / a比来检测Cu-Zn顺序的变化。与以较慢速度冷却的晶体相比,淬灭的样品显示出更高的受体浓度,更低的空穴迁移率和更低的能量光致发光(PL)峰,这与带隙的减小相一致。此外,在最高温度下淬火的样品显示出较低的PL产率与大量的深部缺陷相一致。使用缓慢冷却的CZTSe单晶制造的器件显示出更高的效率,最显着的是V_(OC)的提高:但是,低温强度相关的光致发光测量结果继续表明存在潜在的波动。我们讨论了慢冷样品中的潜在波动可能与无法实现Cu-Zn亚晶格的长距离有序化从而导致阳离子级高低的局部区域以及随之而来的局部变化有关的可能性。带隙。即使在缓慢冷却步骤之后,仍然存在明显的潜在波动,这表明在该系统中消除带尾现象很困难,因此,可能需要其他方法来显着降低V_(OC)缺陷。

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  • 来源
    《Journal of Applied Physics 》 |2017年第6期| 065704.1-065704.8| 共8页
  • 作者单位

    Institute of Energy Conversion, University of Delaware, Newark, Delaware, 19716, USA ,IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA;

    Institute of Energy Conversion, University of Delaware, Newark, Delaware, 19716, USA;

    IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA;

    Institute of Energy Conversion, University of Delaware, Newark, Delaware, 19716, USA;

    IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA;

    Institute of Energy Conversion, University of Delaware, Newark, Delaware, 19716, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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