In-situ synchrotron x-ray characterization of K_2CsSb photocathode grown by ternary co-evaporation

摘要

K_2CsSb is a promising photocathode candidate to serve as an electron source in next-generation light sources such as Free Electron Lasers (FEL) and Energy Recovery Linacs (ERL). As the traditional recipe for creation of K_2CsSb photocathodes typically results in a rough surface that deteriorates electron beam quality, significant effort has been made to explore novel growth methods for K_2CsSb photocathodes. In this paper, a method of ternary co-evaporation of K, Cs, and Sb is described. By using in-situ synchrotron X-ray techniques, the quality of the photocathode is characterized during and after the growth. K_2CsSb photocathodes grown by this method on Si (100) and MgO (001) substrates show strong (222) texture, and the two photocathodes exhibit 1.7% and 3.4% quantum efficiencies at a wavelength of 530 nm, with a rms surface roughness of about 2-4 nm. This represents an order of magnitude reduction in roughness compared to typical sequential deposition and should result in a significant improvement in the brightness of the generated electron beam.