首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers & Short Notes >Position Dependent Stress Distribution of Indium-Tin-Oxide on Polymer Substrate by Applying External Bending Force
【24h】

Position Dependent Stress Distribution of Indium-Tin-Oxide on Polymer Substrate by Applying External Bending Force

机译:施加外部弯曲力在聚合物基体上铟锡氧化物的位置相关应力分布

获取原文
获取原文并翻译 | 示例
           

摘要

In this paper, we investigated the position-dependent stress distribution of indium-tin-oxide (ITO) film on a polycarbonate (PC) substrate by applying an external bending force. It was found that crack density is maximum at the center position and decreases toward the edge. In accordance with crack distribution, it was observed that the change is electrical resistivity of ITO islands is maximum at the center and decreases toward the edge. From the result that crack density increases at the same island position as face-plate distance (L) decreases, it is evident that more stress is imposed on the same island position as L decreases.
机译:在本文中,我们通过施加外部弯曲力研究了聚碳酸酯(PC)基板上铟锡氧化物(ITO)膜的位置相关应力分布。发现裂纹密度在中心位置最大,并向边缘减小。根据裂纹分布,观察到ITO岛的电阻率的变化在中心处最大,而在边缘处减小。从随着面板距离(L)减小,在相同的岛位置处裂纹密度增加的结果,可以看出,随着L的减小,在相同的岛位置处施加更大的应力。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号