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首页> 外文期刊>Japanese Journal of Applied Physics. Part 1, Regular Papers, Brief Communications & Review Papers >Diamond-Like Amorphous Carbon Films Deposited for Field-Emission Use by Upper-Electrode-RF-Power-Controlled Supermagnetron Plasma
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Diamond-Like Amorphous Carbon Films Deposited for Field-Emission Use by Upper-Electrode-RF-Power-Controlled Supermagnetron Plasma

机译:上电极射频功率控制的超磁控等离子体沉积用于场发射的类金刚石非晶碳膜

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Nitrogenated and hydrogenated diamond-like amorphous carbon (DAC:N and DAC:H) films were synthesized using i-C_4H_(10)/ (N_2 and H_2) Supermagnetron plasma, respectively. The upper- and lower-electrode rf powers (UPRF/LORF) were controlled to be 100-800/100 W, and N_2 and the H_2 concentrations were selected to be 25 and 20%, respectively. In the DAC:N layer deposited at 300/100 W, the nitrogen atom concentration was measured to be 1.7 mass %. In the case of DAC:N film, the lowest threshold electric field intensity (E_(TH)) was observed to be 12V/μm at the growth condition of 300/100 W. In the case of a DAC:H planar structure, the lowest E_(TH) was 13 V/μm for 800/100 W deposition. In both types in the films with the lowest E_(TH), we observed the same optical band gap of approximately 1.2eV. The optimum distribution and size of sp~2 CC nanoclusters formed in both the DAC layers probably caused the E_(TH) to decrease.
机译:分别使用i-C_4H_(10)/(N_2和H_2)超磁控等离子体合成了氮化和氢化的类金刚石非晶碳(DAC:N和DAC:H)薄膜。上电极射频功率和下电极射频功率(UPRF / LORF)控制为100-800 / 100 W,N_2和H_2的浓度分别选择为25%和20%。在以300 / 100W沉积的DAC:N层中,测得氮原子浓度为1.7质量%。在DAC:N膜的情况下,在300/100 W的生长条件下观察到的最低阈值电场强度(E_(TH))为12V /μm。在DAC:H平面结构的情况下, 800/100 W沉积的最低E_(TH)为13 V /μm。在两种具有最低E_(TH)的薄膜中,我们观察到相同的光学带隙约为1.2eV。在两个DAC层中形成的sp〜2 CC纳米簇的最佳分布和大小可能导致E_(TH)降低。

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