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机译:界面氮化物层对SiO-2 /氮化物/ SiC金属-绝缘体-半导体二极管电学特性的影响
Department of Electrical and Electronic Engineering, Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan;
Department of Electrical and Electronic Engineering, Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan;
Department of Electrical and Electronic Engineering, Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan;
Department of Electrical and Electronic Engineering, Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan;
Department of Electrical and Electronic Engineering, Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan;
Department of Electrical and Electronic Engineering, Faculty of Engineering, Shinshu University, 4-17-1 Wakasato, Nagano 380-8553, Japan;
机译:基于N-4H SiC的金属 - 绝缘体 - 半导体(MIS)二极管的电气和频率效应与Si_3N_4薄膜夹层
机译:界面涂层和氮化物增强添加剂对Hi-Nicalon SiC纤维增强反应粘结氮化硅复合材料性能的影响
机译:界面涂层和氮化物增强添加剂对Hi-Nicalon SiC纤维增强反应粘结氮化硅复合材料性能的影响
机译:基于III氮化物的金属绝缘体 - 半导体结构的电气特性和界面性能
机译:界面特性对金属氮化镓异质结构电性能的影响。
机译:通过层状氮化钛/碳氮化钛结构的活性界面增强的氧还原电催化性能
机译:用于增强Al / SiNx的电子回旋共振沉积氮化硅双层的电学特性:H / InP金属-绝缘体-半导体结构的制造
机译:界面涂层和氮化物增强添加剂对Hi-Nicalon siC纤维增强反应烧结氮化硅复合材料性能的影响