Nondestructive Measurement of Nonlinear Conduction of Nanoscale Materials,Nanoscale SiO_2, and K0.3MoO_3 by Pulse Photoconductivity Method

摘要

We propose a pulse photoconductivity method (PPCM) for the nondestructive measurement of nanoscale materials with abrupt transitions into higher conduction states from insulated states. The nonlinear conductivity of the highly insulating SiO_2 and the charge density wave (CDW) are observed and demonstrated in a short time even for long-time-constant circuits. One can determine the instantaneity of the PPCM in the case of applying an in-line evaluation technique to the LSI industry.