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首页> 外文期刊>Japanese journal of applied physics >Squareness Control in Polarization-Electric Field Hysteresis Curves in Rhombohedral Pb(Zr,Ti)O_3 Films
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Squareness Control in Polarization-Electric Field Hysteresis Curves in Rhombohedral Pb(Zr,Ti)O_3 Films

机译:菱面体Pb(Zr,Ti)O_3薄膜的极化电场滞后曲线的垂直度控制

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摘要

Squareness in polarization-electric field hysteresis loops of (100)-oriented epitaxial and fiber-textured rhombohedral Pb(Zr,Ti)O_3 films prepared on (100) SrTiO_3 and (100) Si substrates, respectively, was investigated as a function of temperature. The ratio of remanent polarization to saturation polarization (P_r/P_(sat)) decreased with increasing temperature for all films. It depends on the kind of substrates and the remained strain in the in-plane orientation. These data suggest that the existing strain in the films possibly affects the temperature dependence of the P_r/P_(sat) ratio.
机译:研究了分别在(100)SrTiO_3和(100)Si衬底上制备的(100)取向外延和纤维化菱形Pb(Zr,Ti)O_3薄膜的极化电场磁滞回线中的垂直度。所有膜的剩余极化率与饱和极化率之比(P_r / P_(sat))随温度升高而降低。这取决于基板的种类和面内取向的残留应变。这些数据表明,膜中存在的应变可能会影响P_r / P_(sat)比的温度依赖性。

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