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首页> 外文期刊>Japanese journal of applied physics >Optically-pumped 285 nm edge stimulated emission from AlGaN-based LED structures grown by MOCVD on sapphire substrates
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Optically-pumped 285 nm edge stimulated emission from AlGaN-based LED structures grown by MOCVD on sapphire substrates

机译:蓝宝石衬底上通过MOCVD生长的AlGaN基LED结构的光泵浦285 nm边缘激发发射

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摘要

285 nm stimulated emission (SE) is demonstrated at room temperature from optically-pumped AlGaN multiple quantum wells (MQWs) deposited between a Si-doped AlGaN current spreading layer and a 25 nm Mg-doped p-type AlGaN clad layer. The epitaxial structures were grown by low pressure metalorganic chemical vapor deposition (MOCVD) on high-quality AlN/sapphire templates and a pulsed ArF excimer laser was used as the excitation source for lasing experiments. The threshold power density (Pth) was measured to be 970 kW/cm~2 and the SE was strongly polarized in transverse electric (TE) mode. The minimum emission linewidth was ~2 nm. The high value of Pth is primarily attributed to optical losses due to pump laser absorption in the top p-AlGaN. Our results show the viability of the MOCVD growth technology in conjunction with c-plane sapphire substrates to develop electrically-pumped deep-UV laser diodes.
机译:在室温下,通过在Si掺杂的AlGaN电流扩散层和25 nm的Mg掺杂的p型AlGaN覆盖层之间沉积的光泵浦AlGaN多量子阱(MQW)证实了285 nm激发发射(SE)。通过低压金属有机化学气相沉积(MOCVD)在高质量的AlN /蓝宝石模板上生长外延结构,并使用脉冲ArF准分子激光作为激发实验的激发源。阈值功率密度(Pth)经测量为970 kW / cm〜2,并且SE在横向电(TE)模式下被强烈极化。最小发射线宽为〜2 nm。 Pth的高值主要归因于顶部p-AlGaN中泵浦激光吸收引起的光损耗。我们的结果表明,MOCVD生长技术与c面蓝宝石衬底一起开发电泵浦深紫外激光二极管的可行性。

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  • 来源
    《Japanese journal of applied physics》 |2014年第11期|112101.1-112101.4|共4页
  • 作者单位

    Nitek Inc., Columbia, SC 29201, U.S.A.;

    Department of Electrical Engineering, University of South Carolina, Columbia, SC 29201, U.S.A.;

    Department of Electrical Engineering, University of South Carolina, Columbia, SC 29201, U.S.A.;

    Nitek Inc., Columbia, SC 29201, U.S.A.;

    Nitek Inc., Columbia, SC 29201, U.S.A.;

    Nitek Inc., Columbia, SC 29201, U.S.A.;

    Department of Electrical Engineering, University of South Carolina, Columbia, SC 29201, U.S.A.;

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