Analysis of trap and its impact on InGaN-based blue light-emitting diodes using current-transient methodology

摘要

A reversible increase in the current of InGaN-based blue LEDs is observed when constant forward voltage is applied. This characteristic is assumed to be the result of trapping process, and a trap activation energy of 0.30 eV is extracted. Through a numerical simulation, it is confirmed that the multi-quantum well (MQW) barrier height is reduced by the hole trapping process and that the current is increased by lowering this barrier. We also confirmed the effect of this trap on the optical characteristics of InGaN-based blue LEDs by a numerical simulation and measurement.