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Electrical characterization of thieno[3,4-b]thiophene and benzodithiophene copolymer using field-effect transistor configuration

机译:噻吩[3,4-b]噻吩和苯并二噻吩共聚物的场致晶体管电学表征

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摘要

A thieno[3,4-b]thiophene and benzodithiophene copolymer PTB7, which has received much attention as a donor material of organic solar cells, is electrically characterized using a field-effect transistor (FET) configuration. The hole mobility of PTB7 FETs is ~2.0 × 10~(-3)cm~2·V~(-1)·s~(-1), which is independent of annealing temperature, while the threshold voltage shifts towards a negative value with increasing annealing temperature. This is due to the increase in the density of deep trapping states with thermal annealing. The threshold voltage also shifts towards a negative value after aging, indicating that additional deep trapping states are generated in PTB7 thin films even at room temperature.
机译:噻吩并[3,4-b]噻吩和苯并二噻吩共聚物PTB7作为有机太阳能电池的供体材料受到了广泛关注,并使用场效应晶体管(FET)进行了电气表征。 PTB7 FET的空穴迁移率为〜2.0×10〜(-3)cm〜2·V〜(-1)·s〜(-1),与退火温度无关,而阈值电压向负值偏移随着退火温度的升高。这是由于热退火导致深陷阱态密度的增加。老化后,阈值电压也会向负值偏移,这表明即使在室温下,PTB7薄膜中也会产生其他深陷阱状态。

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  • 来源
    《Japanese journal of applied physics》 |2014年第5期|050305.1-050305.4|共4页
  • 作者单位

    Department of Physics and Electronics, Osaka Prefecture University, Sakai 599-8531, Japan;

    Department of Physics and Electronics, Osaka Prefecture University, Sakai 599-8531, Japan,The Research Institute for Molecular Electronic Devices, Osaka Prefecture University, Sakai 599-8531, Japan;

    Department of Physics and Electronics, Osaka Prefecture University, Sakai 599-8531, Japan,The Research Institute for Molecular Electronic Devices, Osaka Prefecture University, Sakai 599-8531, Japan;

    Department of Physics and Electronics, Osaka Prefecture University, Sakai 599-8531, Japan,The Research Institute for Molecular Electronic Devices, Osaka Prefecture University, Sakai 599-8531, Japan;

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