Quality and exposure control in semiconductor manufacturing. Part I: Modelling

摘要

The purpose of this paper is to present a heuristic algorithm for quality control planning from an insurance perspective. The approach proposed here is designed to judiciously allocate controls in two stages: one to manage risk exposure, in terms of potential product loss, and the second to improve the effectiveness of the controls themselves. The method employed to evaluate this algorithm is based on three comparisons. One of these is presented in the first part of the paper and the other two in the second part. The test provided in this first part of the paper is performed on a simplified case study and compares the proposed heuristic algorithm (HA) to an optimised allocation (OA) method. The main objective of this paper is to present, in detail, a quality control planning method which allocates measurement resources with the aim of remaining below a threshold limit of risk exposure and of improving the effectiveness of the controls. The evaluation presented in the second part of the paper underscores the potential, as well as the limitations, of the proposed algorithm.