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Microwave Dielectric Properties of Fused Silica Prepared by Different Approaches

机译:不同方法制备的熔融石英的微波介电性能

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摘要

Fused silica was prepared by different approaches, and the microwave dielectric properties were investigated. For the fused silica sintered at 1100℃ by solid-state sintering, the dielectric constant (ε_r) and Qf value increased with increasing the sintering time up to 5 h, while the temperature coefficient of resonant frequency (τ_f decreased. The optimal properties with low ε_r of 3.72, high Qf value of 44,300 GHz, and low τ_f of -14.4 ppm/℃ were achieved when sintered at 1100℃ for 5 h. The microwave dielectric properties could be further improved by other preparing approaches, as listed below: ε_r = 3.90, Qf= 63,500 GHz, τ_f= -5.7 ppm/℃ for spark plasma sintering, and ε_r = 3.83, Qf= 122,100 GHz, τ_f= -8.3 ppm/℃ for melting method. The results showed that fused silica was a good candidate as a microwave substrate material.
机译:采用不同的方法制备了熔融石英,并研究了其微波介电性能。固态烧结在1100℃下烧结的熔融石英,随着烧结时间的增加,其介电常数(ε_r)和Qf值增加到5 h,而谐振频率温度系数(τ_f)减小,最佳性能为低。在1100℃烧结5 h时,ε_r为3.72,Qf值较高,为44,300 GHz,τ_f较低,为-14.4 ppm /℃,可以通过其他制备方法进一步改善微波介电性能,如下所示:ε_r= 3.90,Qf = 63,500 GHz,火花等离子体烧结的τ_f= -5.7 ppm /℃,ε_r= 3.83,Qf = 122,100 GHz,熔化法的τ_f= -8.3 ppm /℃,结果表明,熔融石英是很好的选择作为微波衬底材料。

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    Laboratory of Dielectric Materials, Department of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    Laboratory of Dielectric Materials, Department of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    Laboratory of Dielectric Materials, Department of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    Laboratory of Dielectric Materials, Department of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    Laboratory of Dielectric Materials, Department of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    Laboratory of Dielectric Materials, Department of Materials Science & Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

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