Survey on recent counterfeit IC detection techniques and future research directions

摘要

In recent years, globalization of the semiconductor supply chain has led to a more complex production cycle with parts coming from various producers in diverse locations. Outsourcing reduces cost but leads to security vulnerabilities, and one of its forms is counterfeiting. Counterfeit ICs, if successfully embedded in an electronic device, may lead to severe consequences with potentially degraded quality, reliability and performance. Wide-spread efforts have been made both in the industry and academia to develop effective countermeasures against counterfeit ICs. In this paper, we provide a comprehensive review of recent counterfeit detection and avoidance techniques. We see that in its current state, one needs to go through a suite of techniques in order to cover testing against all the possible counterfeit types.