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首页> 外文期刊>IEEE Transactions on Instrumentation and Measurement >Narrowband multifrequency binary measurement using phase shift keyed symbols
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Narrowband multifrequency binary measurement using phase shift keyed symbols

机译:使用相移键控符号的窄带多频二进制测量

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摘要

Multifrequency binary testing (MBT), which uses multifrequency binary sequence (MBS) test signals, with high signal-to-noise power ratios for their dominant harmonics, to measure frequency response is considered. Information theory, in the form of descriptive languages and codes, digital modulation, and redundancy is used to design novel phase-shift-keyed (PSK) MBS symbols. A signal zooming operation, similar to optical zooming, is used to allow narrowband frequency response measurement with a high spectral resolution.
机译:考虑了多频二进制测试(MBT),该测试使用多频二进制序列(MBS)测试信号(其高次谐波具有较高的信噪功率比)来测量频率响应。信息论以描述性语言和代码,数字调制和冗余的形式用于设计新颖的相移键控(PSK)MBS符号。类似于光学缩放的信号缩放操作用于允许以高频谱分辨率进行窄带频率响应测量。

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