首页> 外国专利> MEASURING AMPLITUDE AND PHASE RESPONSE OF MEASUREMENT INSTRUMENT WITH BINARY PHASE SHIFT KEYING TEST SIGNAL

MEASURING AMPLITUDE AND PHASE RESPONSE OF MEASUREMENT INSTRUMENT WITH BINARY PHASE SHIFT KEYING TEST SIGNAL

机译:二进制相移键控测试信号测量仪器的幅值和相位响应

摘要

A system and method employ an exclusive-OR gate having a first input configured to receive an RF carrier signal having an RF carrier, and a second input configured to receive a square wave signal having a square wave frequency, to output to a signal processing channel under test a binary phase shift keying (BPSK) signal comprising the RF carrier signal modulated by the square wave signal. A digital signal processor is configured to receive from the signal processing channel in-phase (I) and quadrature-phase (Q) data produced by the signal processing channel in response to the BPSK signal, and to process the I and Q data to determine an amplitude response and phase response of the signal processing channel as a function of frequency.
机译:一种系统和方法采用异或门,该异或门具有被配置为接收具有RF载波的RF载波信号的第一输入和被配置为接收具有方波频率的方波信号的第二输入以输出到信号处理通道在测试中,二进制相移键控(BPSK)信号包括由方波信号调制的RF载波信号。数字信号处理器配置为从信号处理通道接收信号处理通道响应BPSK信号而产生的同相(I)和正交相(Q)数据,并处理I和Q数据以确定信号处理通道的幅度响应和相位响应与频率的关系。

著录项

  • 公开/公告号US2017317792A1

    专利类型

  • 公开/公告日2017-11-02

    原文格式PDF

  • 申请/专利权人 KEYSIGHT TECHNOLOGIES INC.;

    申请/专利号US201615144757

  • 发明设计人 EDWARD M. BARICH;

    申请日2016-05-02

  • 分类号H04L1/24;H04L27/20;

  • 国家 US

  • 入库时间 2022-08-21 13:49:36

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