An improved de-embedding technique for the measurement of the complex constitutive parameters of materials using a stripline field applicator

摘要

A method for measuring the electromagnetic constitutive parameters of materials using a strip-transmission-line field applicator is presented. A technique is developed to measure the scattering parameters of the imperfect transition regions between the applicator coaxial terminal ports and the front and back terminal planes of the material sample in stripline, S-parameters of the sample region are subsequently deembedded from the coaxial-terminal model. The complex permittivity and permeability of the sample are easily related to the sample's S-parameters through well-known analytic relations. Measured constitutive parameters are presented for several representative materials.