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An improved measurement technique for retrieval of effective constitutive properties of thin dielectric/magnetic and metamaterial samples

机译:一种改进的测量技术,可检索薄的介电/磁性和超材料样品的有效本构特性

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An improved partially filled waveguide based technique for the simultaneous measurement of complex permittivity and permeability of thin dielectric-magnetic and metamaterial samples is presented. The proposed approach requires placing a test specimen longitudinally at the centre of a rectangular waveguide cross section for the measurement of scattering coefficient in the specified frequency band. The constitutive properties of the specimen are determined in terms of the measured scattering coefficients using the newly derived expressions, which are based on the solution of the corresponding transcendental equation. The proposed approach is validated by measuring the permittivity and permeability of few standard samples, and comparing the results with the data available in literature. The overall procedure is non-iterative, which makes it quite versatile, and envisages the possibility of even online monitoring of certain parameters.
机译:提出了一种改进的基于部分填充波导的技术,用于同时测量薄介电和超材料样品的复介电常数和磁导率。提出的方法需要将试样纵向放置在矩形波导横截面的中心,以测量指定频段内的散射系数。使用新推导的表达式根据测得的散射系数确定样品的本构特性,这些表达式基于相应的先验方程的解。通过测量少量标准样品的介电常数和磁导率,并将结果与​​文献中提供的数据进行比较,可以验证该方法的有效性。整个过程是非迭代的,这使其非常通用,并设想了甚至可以在线监视某些参数的可能性。

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