Wideband on-wafer noise measurement setup for noise characterization of active devices in the low VHF band

摘要

This paper addresses a new wideband on-wafer measurement test set designed for noise characterization of microwave active devices over the frequency range of 300 kHz to 150 MHz. Noise parameters obtained from the multiple impedance technique on a GaAlAs/GaAs heterojunction bipolar transistor (HBT) from 300 kHz to 70 MHz are reported and compared with low-frequency noise data. Investigation of the excess noise sources of III-V HBT's is performed well above the 100 kHz frequency limit of standard dynamic signal analyzers and noise modeling of these devices is reported.