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Architecture and verification of the row chain cell array for polymer random access memory

机译:聚合物随机存取存储器的行链单元阵列的体系结构和验证

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摘要

A polymer memory, that is considered as one of the next-generation nonvolatile memories, has various excellent electrical and mechanical properties such as small cell feature sizes, high density integrations, and mass-producibility. Although the polymer memories have important advantages for reliability, the peripheral circuits of the polymer memories have not been studied yet, thereby not many research articles available. In this paper, we analyzed and simulate the row chain cell array structure as cross-point cell scheme and demonstrated its ability to correctly read data and reduce noise between cells. Also we using the CMOS 0.35um process, we verified and simulated with test result for the row chain cell array.
机译:被认为是下一代非易失性存储器之一的聚合物存储器具有各种出色的电气和机械性能,例如小单元特征尺寸,高密度集成和批量生产。尽管聚合物存储器在可靠性方面具有重要的优势,但是尚未研究聚合物存储器的外围电路,因此没有太多可用的研究文章。在本文中,我们分析和模拟了作为交叉点单元方案的行链单元阵列结构,并展示了其正确读取数据并减少单元间噪声的能力。同样,我们使用CMOS 0.35um工艺,对行链单元阵列的测试结果进行了验证和仿真。

著录项

  • 来源
    《電子情報通信学会技術研究報告》 |2009年第98期|p.201-204|共4页
  • 作者

    J.H.Kim; C.Y.Ahn; S. S. Lee;

  • 作者单位

    Electronics and Computer Engineering, Hanyang University, 17 Hangdang-Dong, Sungdong-Ku, Seoul, 133-791, Korea;

    Electronics and Computer Engineering, Hanyang University, 17 Hangdang-Dong, Sungdong-Ku, Seoul, 133-791, Korea;

    Electronics and Computer Engineering, Hanyang University, 17 Hangdang-Dong, Sungdong-Ku, Seoul, 133-791, Korea;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    polymer memory; nonvolatile memory; leakage current;

    机译:聚合物记忆非易失性存储器漏电流;
  • 入库时间 2022-08-18 00:35:41

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