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Preparation of Transparent Conducting ZnO Thin Films Prepared by Laser Ablation Method Using Split Target

机译:分裂靶激光烧蚀法制备ZnO透明导电薄膜

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摘要

Thin films of ZnO doped with Al_2O_3, Ga_2O_3, In_2O_3, SnO_2, ITO, Ag_2O and CuO have been deposited on glass substrates by a pulsed laser deposition technique using an ArF laser (λ=193nm). The lowest resistivity was obtained for films deposited from the target with 2wt/100 Al_2O_3 (AZO (2 wt/100)); the resistivity of 1.43 x 10~-4Ω.cm was obtained at a substrate temperature of 300℃. On the other hand, there were minute irregularities on the surfaces of ZnO films doped with 4-7 wt/100 Ga_2O_3(GZO (4-7wt/100)).
机译:掺杂有Al_2O_3,Ga_2O_3,Ga_2O_3,In_2O_3,SnO_2,ITO,Ag_2O和CuO的ZnO薄膜已通过使用ArF激光器(λ= 193nm)的脉冲激光沉积技术沉积在玻璃基板上。用2wt / 100 Al_2O_3(AZO(2 wt / 100))从靶材沉积的薄膜获得最低电阻率;在300℃的衬底温度下获得1.43×10〜-4Ω.cm的电阻率。另一方面,掺杂有4-7wt / 100Ga_2O_3(GZO(4-7wt / 100))的ZnO膜的表面上有微小的凹凸。

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