Hard And Soft Failures In Dynamic RAM Fault Tolerant Memories

摘要

A system reliability model is developed which includes a dynamic random-access memory (RAM). The model is useful for computing the reliability of a system with a fault-tolerant memory which uses techniques such as hardware redundancy, and error detection and (single error) correction algorithms. Hard and soft failure rates have been estimated to be constants. System behavior is treated as a Markov process.