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Analytical Switching Loss Modeling Based on Datasheet Parameters for mosfets in a Half-Bridge

机译:基于半桥 mosfet s的数据表参数的分析开关损耗建模

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Modern wide-bandgap devices, such as SiC- or GaN-based devices, feature significantly reduced switching losses, and the question arises if soft-switching operating modes are still beneficial. For most of the semiconductor devices, only limited information is available to estimate the switching losses. Especially, if a wide operating range is desired, excessive measurements have to be performed to determine the switching losses for arbitrary operating points. Therefore, in this paper, a fast calculation method to determine the switching losses based on the charge equivalent approximation of the MOSFET capacitances, relying only on datasheet parameters, is presented. In addition, the turn-OFF losses at high switching currents are investigated, and an analytical expression to estimate the maximum current range for which the MOSFET can be turned OFF with negligible switching losses is proposed.
机译:现代宽带隙设备,如SIC-或GaN的设备,功能显着降低了切换损耗,并且如果软切换操作模式仍然有益,则出现问题。对于大多数半导体器件,只有有限的信息可用于估计切换损耗。特别是,如果需要宽的操作范围,则必须执行过度测量以确定任意操作点的开关损耗。因此,在本文中,呈现了一种快速计算方法,用于确定基于MOSFET电容的电荷等效逼近的开关损耗,仅依赖于数据表参数。另外,提出了高开关电流的关断损耗,并提出了分析表达,以估计可以通过可忽略的开关损耗关闭MOSFET的最大电流范围。

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