Low dose rate space estimates for integrated circuits using real time measurements and linear system theory

摘要

From real-time response measurements of the supply currents for some CMOS integrated circuits at various constant dose rates, it was possible to extrapolate time to failure back to spacelike low dose rates. Linear systems theory and convolution combine to give a quantitative way of characterizing the response of a device to radiation at various dose rates. No detailed knowledge of the damage mechanisms is required. Real-time responses during and after radiation provide the necessary information for each dose rate measurement. Reasonably successful extrapolations from accurate generalized response functions can be made to lower dose rates. Proton measurements of the low dose rate response for the ADSP2100 digital signal processor and a SEEQ EEPROM indicate increased survivability.