Effects of /spl gamma/-rays on JFET devices and circuits fabricated in a detector-compatible Process

摘要

This work is concerned with the effects of /spl gamma/-rays on the static, signal and noise characteristics of JFET-based circuits belonging to a fabrication technology made available by the Istituto per la Ricerca Scientifica e Tecnologica (ITC-IRST), Trento, Italy. Such a process has been tuned with the aim of monolithically integrating the readout electronics on the same highly resistive substrate as multielectrode silicon detectors. The radiation tolerance of some test structures, including single devices and charge sensitive amplifiers, was studied in view of low-noise applications in industrial and medical imaging, X- and /spl gamma/-ray astronomy and high energy physics experiments. This paper intends to fill the gap in the study of gamma radiation effects on JFET devices and circuits belonging to detector-compatible technologies.