Parameterization of neutron-induced SER in bulk SRAMs from reverse Monte Carlo Simulations

摘要

We used a reverse Monte Carlo method for calculating SEU cross section within the RPP approximation. The method allows reducing calculation times and accounting for long range particles which may be involved in a failure even if produced far from the sensitive volume. A global parameterization of the Soft Error Rate is given as a function of the sensitive volume size and the critical charge. This parameterization allows obtaining quickly the SER of a generic structure, which may be used as a useful guideline.