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Estimation of Complex Permittivity of Arbitrary Shape and Size Dielectric Samples Using Cavity Measurement Technique at Microwave Frequencies

机译:在微波频率下利用腔测量技术估算任意形状和尺寸介电样品的复介电常数

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摘要

In this paper, a simple cavity measurement technique is presented to estimate the complex permittivity of arbitrary shape and size dielectric samples. Measured shift in resonant frequency and change in quality factor due to the dielectric sample loading in the cavity is compared with simulated values obtained using the finite-element method software High Frequency Structure Simulator and matched using the Newton-Raphson method to estimate the complex permittivity of a arbitrary shape and size dielectric sample. Complex permittivity of Teflon (PTFE) and an MgO-SiC composite is estimated in the S-band using this method for four different samples of varying size and shapes. The result for Teflon shows a good agreement with the previously published data, and for the MgO-SiC composite, the estimated real and imaginary parts of permittivity for four different shape and size samples are within 10%, proving the usefulness of the method. This method is particularly suitable for estimation of complex permittivity of high-loss materials.
机译:在本文中,提出了一种简单的腔测量技术来估计任意形状和尺寸的电介质样品的复介电常数。将由于谐振腔中的电介质样品加载而导致的谐振频率的偏移和品质因数的变化与使用有限元方法软件High Frequency Structure Simulator获得的仿真值进行比较,并使用Newton-Raphson方法进行匹配,以估算谐振腔的复介电常数。任意形状和大小的介电样品。使用此方法,对于四个不同尺寸和形状的不同样品,在S带中估算了特氟龙(PTFE)和MgO-SiC复合材料的复介电常数。铁氟龙的结果与先前发表的数据显示出良好的一致性,而对于MgO-SiC复合材料,四种不同形状和大小的样品的介电常数的实部和虚部估计值均在10%以内,证明了该方法的有效性。该方法特别适用于估算高损耗材料的复介电常数。

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