机译:扫描微波显微镜中的地形伪影实时去除
Qualcomm Atheros Inc San Jose CA 95110 USA|Univ British Columbia Dept Elect & Comp Engn Vancouver BC V6T 1Z4 Canada;
Qualcomm Atheros Inc San Jose CA 95110 USA|Case Western Reserve Univ Dept Elect & Comp Syst Engn Cleveland OH 44106 USA;
Qualcomm Atheros Inc San Jose CA 95110 USA;
Qualcomm Atheros Inc San Jose CA 95110 USA;
Univ British Columbia Dept Elect & Comp Engn Vancouver BC V6T 1Z4 Canada;
Qualcomm Atheros Inc San Jose CA 95110 USA;
Probes; Surfaces; Microwave theory and techniques; Microwave imaging; Microscopy; Force; Surface topography; Ferroelectrics; hafnium zirconium oxide (HfZrO); image processing; scanning microwave microscopy (SMM); topography removal;
机译:照明模式扫描近场光学显微镜中地形图像和伪影的模拟
机译:在扫描近场光学显微镜中建模地形假象
机译:解开近场扫描微波显微镜图像的地形贡献
机译:剥离条纹:扫描电子显微镜成像的伪像检测和去除
机译:定量扫描生物细胞的微波显微镜显微镜
机译:相关原子力显微镜定量成像-激光扫描共聚焦显微镜实时量化应激源对活细胞的影响
机译:解开近场扫描微波显微镜图像的地形贡献