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Measurement Error of Temperature Coefficient of Resonant Frequency for Microwave Dielectric Materials by TE01δ -Mode Resonant Cavity Method

机译:TE01δ-模式谐振腔法测量微波介电材料谐振频率温度系数的误差

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摘要

The temperature coefficient of resonant frequency of a microwave dielectric material (τf,s) is defined as the τf of an ideal resonant system that is homogeneously filled with this material, while it is usually measured as the τf of a nonideal resonant system (τf,r) such as a cavity dielectric resonator. In the present work, finite element analysis is used to investigate the measurement error of τf,s by TE01δ-mode resonant cavity method, for which the sample is placed on a support and far from the cavity walls. Several error sources contribute to the total measurement error, which is usually several ppm/°C and decreases with the dielectric constant of the sample (εr,s). Besides, the measurement error is strongly dependent on the cavity size. In comparison, the measurement error is much lower and usually within 1 ppm/°C for TE011-mode parallel plate method, where the sample is clamped between two metal plates. It is suggested to measure τf,s by TE011-mode parallel plate method but not by TE01δ-mode resonant cavity method if τf,s is treated as τf,r, especially whenεr,s is low and high measurement accuracy is needed. If TE01δ-mode resonant cavity method is used to measure τf,s, the result must be corrected with the aid of numerical calculation to improve the measurement accuracy.
机译:微波介电材料的谐振频率温度系数(τf,s)定义为均匀填充有该材料的理想谐振系统的τf,而通常将其测量为非理想谐振系统的τf(τf, r)如腔介质谐振器。在本工作中,使用有限元分析来研究TE01δ模式共振腔法对τf,s的测量误差,为此,将样品放置在支撑物上并远离腔壁。几个误差源会导致总测量误差,通常为几ppm /°C,并且会随样品的介电常数(εr,s)降低。此外,测量误差在很大程度上取决于腔的尺寸。相比之下,TE011模式平行平板方法的测量误差要低得多,通常在1 ppm /°C之内,其中样品被夹持在两个金属平板之间。如果将τf,s视为τf,r,建议使用TE011模式平行板法而不是TE01δ模式共振腔法来测量τf,s,尤其是当εr,s低且需要较高的测量精度时。如果使用TE01δ模式共振腔法来测量τf,s,则必须借助数值计算来校正结果,以提高测量精度。

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