Complex Dielectric Constant Measurements by the Microwave Resonant Cavities Method

摘要

A complex dielectric constant measurement method for solids, using cylindrical and parallelipipedic microwave resonant cavities is presented. This method provides high accuracy when calculating the value of epsilonsup(*) for dielectric, semiconductor, ferroelectric and ferromagnetic materials. The paper contains a short theoretical approach, the description of the experimental method, as well as some experimental results obtained in the frequency band. (Atomindex citation 12:597546)