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首页> 外文期刊>IEEE Transactions on Microwave Theory and Techniques >An Electromagnetic Bandgap Structure Integrated With RF LNA Using Integrated Fan-Out Wafer-Level Package for Gigahertz Noise Suppression
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An Electromagnetic Bandgap Structure Integrated With RF LNA Using Integrated Fan-Out Wafer-Level Package for Gigahertz Noise Suppression

机译:使用集成扇出晶片级封装与RF LNA集成的电磁带隙结构,可抑制千兆赫兹噪声

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This paper presents a periodic electromagnetic bandgap (EBG) structure in the integrated fan-out wafer-level package (InFO-WLP) technology for gigahertz-band noise suppression. The proposed EBG structure consists of an$LC$resonator with two symmetrical spiral inductors in series and a shunt metal–insulator–metal capacitor between power and ground planes. The third-order equivalent model of the EBG structure is also proposed and extracted by field solver ANSYS Q3D to model the performance. In addition, the EBG arrays with different sizes of unit cell and the corresponding stopband bandwidth and isolation were characterized. The measurement results show that the proposed$1 imes 4$EBG array of 600-$mu ext{m}$square unit cell can achieve a 29.5-GHz stopband bandwidth together with an over 30-dB isolation level. Furthermore, by using the InFO-WLP technology, the proposed EBG structure is integrated with an RF low-noise amplifier (LNA) fabricated in a 16-nm FinFET technology as a case study to validate the power noise immunity. The experimental results show that the measured output spectrum of LNA integrated with the proposed EBG structure at the power plane can suppress the noise tone from −37.37 to −68.65 dBm.
机译:本文提出了一种集成的扇出晶圆级封装(InFO-WLP)技术中的周期性电磁带隙(EBG)结构,用于抑制千兆赫兹频带的噪声。提议的EBG结构由 n $ LC $ nresonator,带有两个串联的对称螺旋电感器和一个并联金属绝缘器–电源和接地层之间的金属电容器。还提出了EBG结构的三阶等效模型,并由现场求解器ANSYS Q3D提取以对性能进行建模。另外,表征了具有不同尺寸的晶胞的EBG阵列以及相应的阻带带宽和隔离度。测量结果表明,建议的 n <内联公式xmlns:mml = “ http://www.w3.org/1998/Math/MathML ” xmlns:xlink = “ http://www.w3。 org / 1999 / xlink “> $ 1 times 4 $ nEBG数组600- n $ mu text {m} $ nsquare单位单元可以实现29.5 GHz的阻带带宽以及30 dB以上的隔离度水平。此外,通过使用InFO-WLP技术,将拟议的EBG结构与采用16 nm FinFET技术制造的RF低噪声放大器(LNA)集成在一起,以验证电源抗扰度。实验结果表明,在电源平面上测量的LNA与建议的EBG结构集成的输出频谱可以将噪声色调从-37.37抑制到-68.65 dBm。

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